User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: HP 44701A:Integrating Voltmeter DATE: 03-Apr-97 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 51 NUMBER OF LINES: 303 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON # This procedure is run with the MET/CAL Configuration #1 loaded. 1.001 ASK- R N P F W 1.002 ASK+ X 1.003 HEAD {} 1.004 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 1.005 HEAD {º DC Volts Test º} 1.006 HEAD {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 1.007 HEAD {ÍÍ Offset Test ÍÍ} 1.008 JMP 2.001 1.009 EVAL 2.001 DISP With the mainfram off insert the UUT into SLOT 3. 2.002 DISP ÿ Connect the 5700A and the UUT as follows: 2.002 DISP ÿ [27][91]1m 5700A TO 44701A 2.002 DISP ÿ OUTPUT V ê A HI ÄÄÄÄÄÄÄÄÄ INPUT HI 2.002 DISP ÿ OUTPUT V ê A LO ÄÄÄÄÄÄÄÄÄ INPUT LO 2.003 IEEE [SDC] 2.004 IEEE RST 2.005 IEEE USE 300 2.006 IEEE FUNC DCV; TERM EXT; TRIG AUTO; NPLC 1; DELAY 1 2.007 IEEE RANGE 30 2.008 5700 0.00000V S 2W 2.009 IEEE XRDGS 300 [I] 2.010 MEME 2.011 MEMC V 3.000e-4U 3.001 IEEE RANGE 300 3.002 5700 0.00000V S 2W 3.003 IEEE XRDGS 300 [I] 3.004 MEME 3.005 MEMC V 7.000e-4U 4.001 IEEE RANGE 3 4.002 5700 0.00000V S 2W 4.003 IEEE XRDGS 300 [I] 4.004 MEME 4.005 MEMC V 8.000e-6U 5.001 IEEE RANGE .3 5.002 5700 0.00000V S 2W 5.003 IEEE XRDGS 300 [I] 5.004 MEME 5.005 MEMC V 6.000e-6U 6.001 IEEE RANGE .03 6.002 5700 0.00000V S 2W 6.003 IEEE XRDGS 300 [I] 6.004 MEME 6.005 MEMC V 6.000e-6U 7.001 HEAD {ÍÍ Full Scale ÍÍ} 7.002 JMP 8.001 7.003 EVAL 8.001 IEEE RANGE .03 8.002 5700 30.000000mV S 2W 8.003 IEEE FUNC DCV; TERM EXT; TRIG AUTO; NPLC 1; DELAY 1 8.004 IEEE XRDGS 300 [I] 8.005 MEM* 1000 8.006 MEME 8.007 MEMC mV 0.01500U #! WARNING: Test Tol 1.5e-006, Sys Tol 9.6e-007, TUR 1.562 (< 4.00). 9.001 IEEE RANGE .3 9.002 5700 300.000000mV S 2W 9.003 IEEE XRDGS 300 [I] 9.004 MEM* 1000 9.005 MEME 9.006 MEMC mV 0.0600U #! WARNING: Test Tol 6e-007, Sys Tol 3e-006, TUR 0.200 (< 4.00). 10.001 IEEE RANGE 3 10.002 5700 3.000000V S 2W 10.003 IEEE XRDGS 300 [I] 10.004 MEME 10.005 MEMC V 0.000548U #! Test Tol 0.000548, Sys Tol 1.9e-005, TUR 28.842 (>= 4.00). 11.001 IEEE RANGE 30 11.002 5700 30.000000V S 2W 11.003 IEEE XRDGS 300 [I] 11.004 MEME 11.005 MEMC V 0.00570U #! WARNING: Test Tol 0.00057, Sys Tol 0.00028, TUR 2.036 (< 4.00). 12.001 IEEE RANGE 300 12.002 5700 300.000000V S 2W 12.003 IEEE XRDGS 300 [I] 12.004 MEME 12.005 MEMC V 0.0547U #! WARNING: Test Tol 0.000547, Sys Tol 0.003, TUR 0.182 (< 4.00). 13.001 HEAD {} 13.002 HEAD {ÍÍ Linearity ÍÍ} 13.003 IEEE RANGE 3 13.004 5700 2.000000V S 2W 13.005 IEEE XRDGS 300 [I] 13.006 MEME 13.007 MEMC V 0.000368U #! Test Tol 0.000368, Sys Tol 1.32e-005, TUR 27.879 (>= 4.00). 14.001 5700 1.000000V S 2W 14.002 IEEE XRDGS 300 [I] 14.003 MEME 14.004 MEMC V 0.000188U #! Test Tol 0.000188, Sys Tol 7.2e-006, TUR 26.111 (>= 4.00). 15.001 5700 -1.000000V S 2W 15.002 IEEE XRDGS 300 [I] 15.003 MEME 15.004 MEMC V 0.000188U #! Test Tol 0.000188, Sys Tol 7.2e-006, TUR 26.111 (>= 4.00). 16.001 5700 -2.000000V S 2W 16.002 IEEE XRDGS 300 [I] 16.003 MEME 16.004 MEMC V 0.000368U #! Test Tol 0.000368, Sys Tol 1.32e-005, TUR 27.879 (>= 4.00). 17.001 5700 -3.000000V S 2W 17.002 IEEE XRDGS 300 [I] 17.003 MEME 17.004 MEMC V 0.000548U #! Test Tol 0.000548, Sys Tol 1.9e-005, TUR 28.842 (>= 4.00). 18.001 HEAD {} 18.002 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 18.003 HEAD {º AC Volts Test º} 18.004 HEAD {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 18.005 HEAD {ÍÍ Gain Test ÍÍ} 18.006 JMP 19.001 18.007 EVAL 19.001 IEEE FUNC ACV; RANGE .2 19.002 5700 20.000mV 150H O S 2W 19.003 IEEE XRDGS 300 [I] 19.004 MEM* 1000 19.005 MEME 19.006 MEMC mV 1.050U ÿ200mV 20.001 5700 200.000mV 150H S 2W 20.002 IEEE XRDGS 300 [I] 20.003 MEM* 1000 20.004 MEME 20.005 MEMC mV 2.40U ÿ200mV 21.001 IEEE RANGE 2 21.002 5700 0.200000V 150H S 2W 21.003 IEEE XRDGS 300 [I] 21.004 MEME 21.005 MEMC V 0.01050U ÿ2V 22.001 5700 1.0000V 150H S 2W 22.002 IEEE XRDGS 300 [I] 22.003 MEME 22.004 MEMC V 0.01650U ÿ2V 23.001 5700 2.00000V 150H S 2W 23.002 IEEE XRDGS 300 [I] 23.003 MEME 23.004 MEMC V 0.02400U ÿ2V 24.001 IEEE RANGE 20 24.002 5700 2.00000V 150H S 2W 24.003 IEEE XRDGS 300 [I] 24.004 MEME 24.005 MEMC V 0.1050U ÿ20V 25.001 5700 20.0000V 150H S 2W 25.002 IEEE XRDGS 300 [I] 25.003 MEME 25.004 MEMC V 0.2400U ÿ20V 26.001 IEEE RANGE 200 26.002 5700 20.0000V 150H S 2W 26.003 IEEE XRDGS 300 [I] 26.004 MEME 26.005 MEMC V 1.050U ÿ200V 27.001 5700 200.000V 150H S 2W 27.002 IEEE XRDGS 300 [I] 27.003 MEME 27.004 MEMC V 2.4000U ÿ200V 28.001 HEAD {} 28.002 HEAD {ÍÍ Frequency Response ÍÍ} 28.003 JMP 29.001 28.004 EVAL 29.001 IEEE RANGE .2 29.002 5700 200.0000mV 45H S 2W 29.003 IEEE XRDGS 300 [I] 29.004 MEM* 1000 29.005 MEME 29.006 MEMC mV 2.400U 45H 30.001 5700 200.0000mV 500H S 2W 30.002 IEEE XRDGS 300 [I] 30.003 MEM* 1000 30.004 MEME 30.005 MEMC mV 2.400U 500H 31.001 IEEE RANGE 2 31.002 5700 2.00000V 45H S 2W 31.003 IEEE XRDGS 300 [I] 31.004 MEME 31.005 MEMC V 0.02400U 45H 32.001 5700 2.00000V 500H S 2W 32.002 IEEE XRDGS 300 [I] 32.003 MEME 32.004 MEMC V 0.02400U 500H 33.001 IEEE RANGE 20 33.002 5700 20.0000V 45H S 2W 33.003 IEEE XRDGS 300 [I] 33.004 MEME 33.005 MEMC V 0.24000U 45H 34.001 5700 20.0000V 500H S 2W 34.002 IEEE XRDGS 300 [I] 34.003 MEME 34.004 MEMC V 0.24000U 500H 35.001 IEEE RANGE 200 35.002 5700 200.000V 45H S 2W 35.003 IEEE XRDGS 300 [I] 35.004 MEME 35.005 MEMC V 2.4000U 45H 36.001 5700 200.000V 500H S 2W 36.002 IEEE XRDGS 300 [I] 36.003 MEME 36.004 MEMC V 2.4000U 500H 37.001 HEAD {} 37.002 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍ»} 37.003 HEAD {º Ohms Test º} 37.004 HEAD {ÈÍÍÍÍÍÍÍÍÍÍͼ} 37.005 HEAD {ÍÍ Ohms Offset Test ÍÍ} 37.006 JMP 38.001 37.007 EVAL 38.001 DISP ÿ Connect the 5700A and the UUT as follows: 38.001 DISP ÿ [27][91]1m 5700A TO 44701A 38.001 DISP ÿ OUTPUT V ê A HI ÄÄÄÄÄÄÄÄÄ CURRENT SOURCE HI 38.001 DISP ÿ OUTPUT V ê A LO ÄÄÄÄÄÄÄÄÄ CURRENT SOURCE LO 38.001 DISP ÿ SENSE V ê HI ÄÄÄÄÄÄÄÄÄÄÄ INPUT HI 38.001 DISP ÿ SENSE V ê LO ÄÄÄÄÄÄÄÄÄÄÄ INPUT LO 38.002 IEEE FUNC OHMF; TERM EXT; TRIG AUTO; NPLC 1; DELAY 1 38.003 IEEE RANGE 30 38.004 5700 0.0000Z S 4W 38.005 IEEE XRDGS 300 [I] 38.006 MEME 38.007 MEMC Z 6.0000e-3U 30ê 39.001 IEEE RANGE 300 39.002 5700 0.0000Z S 4W 39.003 IEEE XRDGS 300 [I] 39.004 MEME 39.005 MEMC Z 6.0000e-3U 300ê 40.001 IEEE RANGE 3000 40.002 5700 0.0000Z S 4W 40.003 IEEE XRDGS 300 [I] 40.004 MEME 40.005 MEMC Z 6.0000e-2U 3kê 41.001 IEEE RANGE 30E3 41.002 5700 0.0000Z S 4W 41.003 IEEE XRDGS 300 [I] 41.004 MEME 41.005 MEMC Z 8.0000e-2U 30kê 42.001 IEEE RANGE 300E3 42.002 5700 0.0000Z S 4W 42.003 IEEE XRDGS 300 [I] 42.004 MEME 42.005 MEMC Z 1.0000U 300kê 43.001 IEEE RANGE 3E6 43.002 5700 0.0000Z S 4W 43.003 IEEE XRDGS 300 [I] 43.004 MEME 43.005 MEMC Z 17.000U 3Mê 44.001 HEAD {} 44.002 HEAD {ÍÍ Ohms Gain Test ÍÍ} 44.003 JMP 45.001 44.004 EVAL 45.001 IEEE RANGE 30 45.002 5700 10.00000Z S 4W 45.003 IEEE XRDGS 300 [I] 45.004 MEME 45.005 MEMC Z 0.00900U 46.001 IEEE RANGE 300 46.002 5700 100.0000Z S 4W 46.003 IEEE XRDGS 300 [I] 46.004 MEME 46.005 MEMC Z 0.03100U 47.001 IEEE RANGE 3E3 47.002 5700 1.00000kZ S 4W 47.003 IEEE XRDGS 300 [I] 47.004 MEM/ 1000 47.005 MEME 47.006 MEMC kZ 0.00031U 48.001 IEEE RANGE 30E3 48.002 5700 10.0000kZ S 4W 48.003 IEEE XRDGS 300 [I] 48.004 MEM/ 1000 48.005 MEME 48.006 MEMC kZ 0.002580U 49.001 IEEE RANGE 300E3 49.002 5700 100.000kZ S 4W 49.003 IEEE XRDGS 300 [I] 49.004 MEM/ 1000 49.005 MEME 49.006 MEMC kZ 0.02600U 50.001 IEEE RANGE 3E6 50.002 5700 1.00000MZ S 4W 50.003 IEEE XRDGS 300 [I] 50.004 MEM/ 1000000 50.005 MEME 50.006 MEMC MZ 0.001117U 51.001 HEAD {} 51.002 DISP {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 51.002 DISP {º THIS COMPLETES THE VERIFICATION º} 51.002 DISP {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 51.003 END #! T.U.R.s less than 4.00: 4 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.